Suzhou Electric Appliance Research Institute
期刊號: CN32-1800/TM| ISSN1007-3175

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低壓綜合配電箱溫升影響因素研究

來源:電工電氣發布時間:2021-05-25 10:25 瀏覽次數:17

低壓綜合配電箱溫升影響因素研究

賈曉明1,戴建卓2,賈勇勇2,金心如2,韓侃3
(1 國網江蘇省電力有限公司檢修分公司,江蘇 南京 211103;
2 國網江蘇省電力有限公司電力科學研究院,江蘇 南京 211103;
3 蘇州電器科學研究院股份有限公司,江蘇 蘇州 215104)
 
    摘 要:通過對低壓綜合配電箱 (JP 柜) 的質量抽檢,發現其溫升試驗不合格率較高,一旦溫升超過限值將影響設備安全穩定運行。對不同供應商的 JP 柜開展了溫升試驗,比較了 JP 柜空間布局、塑殼斷路器型號、母排結構尺寸等方面差異,分析了 JP 柜中塑殼斷路器的溫升超標原因,對 JP 柜中塑殼斷路器選用及結構優化等方面提出了相關建議。
    關鍵詞:低壓綜合配電箱 (JP 柜) ;塑殼斷路器;溫升試驗
    中圖分類號:TM594     文獻標識碼:B     文章編號:1007-3175(2021)05-0037-04
 
Research on Influencing Factors of Temperature Rise of
Low-Voltage Integrated Distribution Box
 
JIA Xiao-ming1, DAI Jian-zhuo2, JIA Yong-yong2, JIN Xin-ru2, HAN Kan3
(1 State Grid Jiangsu Electric Power Company Maintenance Branch, Nanjing 211103, China;
2 State Grid Jiangsu Electric Power Company Research Institute, Nanjing 211103, China;
3 Suzhou Electrical Apparatus Science Research Institute Co., Ltd, Suzhou 215104, China)
 
    Abstract: Through the quality inspection of the low-voltage integrated distribution box also called JP cabinet, it is found that the temperature rise test has a high unqualified rate. Once the temperature rise exceeds the limit, the safe and stable operation of the equipment will be affected. The author carried out temperature rise tests on JP cabinets from different suppliers, compared the differences in JP cabinet space layout, molded case circuit breaker model, busbar structure size, etc., and analyzed the reasons for the excessive temperature rise of the molded case circuit breaker in the JP cabinet. Relevant suggestions are put forward for the selection and structural optimization of molded case circuit breakers in JP cabinets.
    Key words: low-voltage integrated distribution box(JP cabinet); molded case circuit breaker; temperature rise test
 
參考文獻
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